Laser Distance Spectrometry will exhibit at the METEC 2015 in Dusseldorf from 16th to 20th June, 2015. We look forward to welcoming you at our booth - Hall 03/C5!
On 18th June, at 9:40 am, in Congress Centre Dusseldorf South, we will also make a special presentation “Automatic system of sinter basicity stabilization based on laser real-time elemental analyser MAYA”.
See you in Dusseldorf!
MAYAon-line elemental LIBS analyzers measure the elemental composition of mineral raw materials on a conveyor belt, falling stream, slurry pipeline, and open-pit wall, detecting all elements, in real time, without sampling. They are used in mining, ore beneficiation (sorting, flotation), raw mix composition stabilization, sintering, quality control in iron, copper, nickel, aluminum, rare earth, cement, coal, phosphate, potash industries. The analyzer does not produce any radiation and is thus fully safe; it can operate 24/7 in automatic mode under heavy conditions; the maintenance is easy and low-cost. Based on our experience, the standard return of investment is in 2-4 months.
Prompt technological control based on real-time on-line data on the composition of raw materials
Improvement of the quality of the finished product as a result of raw materials composition stabilization and/or off-grade/impurities discharging based on online information
No sampling and sample preparation necessary - in the mines and on the pit walls, moving on conveyor belts and pouring into truck, both in the pipelines and in the air
Works for all kinds of materials - mineral ores, both lump and slurry, liquid and gases
Works in various industries: mining and beneficiation of iron and non-ferrous ores, phosphates and potash fertilizers, coal and cement, magnesium and manganese, etc.
Low operating costs
Investments return in 2-4 months depending on application
Advantages of laser-based technique:
Absolute safety for personnel and environment. Simple implementation which does not require obtaining nuclear authority licenses, supervision and inspections
High sensitivity and low limits of detection (LOD) as a result of clear spectral lines of many elements of interest in wide optical wave range
Simultaneous analysis of many elements, including light ones (H, Li, Be, B, C, Na, Mg, Al, Si...)
High accuracy regardless of bulk size, surface quality, thickness of the layer of the material and variation on these parameters